Astronics

Semiconductor Testers


Custom Semi Testers

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Product Information

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Reliability Test Systems

With the rise of high-power RF devices, such as Gallium Nitride (GaN) for telecom infrastructure and defense applications, long-duration, massively-parallel reliability testing of these mission-critical chips is more important than ever.

With over 60 years of test industry leadership and innovation, our team of experienced engineers will work directly with yours to design a solution for your reliability test needs.


Product Information

Are you challenged with long test times, pieced-together test equipment, and manual processes, leaving room for error and imposing costly delays in getting your products to market? Count on the deep expertise of the Astronics team to deliver future-proof reliability test for your critical devices.

TORCH: Thermally-controlled Operational Reliability Chip Tester

TORCH reliability test systemTORCH is a fully-automated, high-throughput, modular test system that can simultaneously test up to 384 sites/DUTs with independent test profiles and parameters. Using accelerated thermal technology, TORCH helps determine the operational life of your device in a fraction of the time. We remove the labor-intensive and time-consuming manual process that is prone to handling faults, and through our state-of-the-art technology, we provide automation that streamlines activities.

Experience increased test capacity, reduced testing times, and improved overall reliability of your defense microelectronics with TORCH.

View the solution sheet

Lighting the Way to Reliable Defense Microelectronics

TORCH offers a variety of test modes and an intuitive graphical user interface that allows quick and easy creation of pre-configured or custom profiles. Highlighted features include:

  • In-Situ Dwell Test Modes:
    • High-Temperature Operating Life (HTOL)
    • Steady-State Life (SSL)
    • Step Stress Testing (SST)
    • Fully Customizable Profiles
  • In-Situ Characterization
  • Intuitive profile management, operation, charting, and data logging
  • Up to x384 DUTs simultaneously
  • Independent control and monitoring of each DUT/ test site
  • Independent temperature control of each DUT from ambient to 200°C, +/- 1.0°C
  • Air-cooled (no refrigerant required)

TORCHLiveCharts

Building Blocks Approach

TORCH drawerWe provide a customizable COTS solution, and our engineer-to-engineer approach ensures the right solution for your test needs by taking into consideration the following building blocks:

  • Automation options: fully-automatic, semi-automatic, manual
  • Measurement science: best practices and innovation
  • Additional insertions: based on test strategy and defect mechanisms
  • Scalable for your needs: up to four (4) racks
  • RF shielded enclosures: for true performance measurement
  • User-friendly software: for each of use and data retrieval/archiving
  • Tester resources: for both test and operation
  • Carrier/ test fixtures: for workflow transport
  • Test strategy and plan: to validate device performance and screen defects
  • Test methodology
  • Cost of test: parallelism and total cost of ownership
  • Product life cycle: design for obsolescence
  • Maintenance strategy: installation, footprint, and maximizing uptime
  • Production plan: labels, serial numbers, traceability, and training
  • Open architecture system components

Services and Support

Together, the synergy of our partnership ensures your success. We offer:

  • Engineer-to-engineer collaborative design and support to configure your system
  • Dedicated program managers
  • A global team supporting installation, training, and maintenance
  • Online help and complete documentation for every solution

Contact & Support